Atomic Force Microscopy
Atomic force microscopy is a very high resolution form of scanning probe microscopy. The atomic force microscope allows for the visualization and measurement of sample topography down to the nanometer scale. AFM can be combined with spectroscopy (FTIR), mechanical analysis (stiffness), and thermal (DSC) methods to provide chemistry and mechanical properties as a function of location on the sample with nanometer resolution.
- More than 1000X better resolution than an optical microscope
- Mechanical Analysis -Map stiffness variations in your sample on the nanoscale
- Nanoscale Thermal Analysis – Measure thermal transitions for polymer layers and particles
- FTIR-Nano – Identify chemical features in films, blends and composites with spatial resolution down to 10nm