Using diffraction grating, ICP-OES separates the light emitted from the plasma into its discrete component wavelength. This system is an optical system with a range of 165-800 nm which can be viewed and measured. Each element is detected by their own distinct set of emission wavelengths.
Boasting a similar elemental range to ICP-MS, ICP-OES is ideally suited for single element analysis, and provides greater accuracy at high concentrations than ICP-MS for single elemental detection, while still detecting ppm levels of single elements.
- High accuracy elemental concentration
- Excellent Quality control method