Time of Flight - Secondary Ion Mass Spectrometry
Navigate surface composition with Chemical Mapping!
When posed with the need for surface sensitive mass spectrometry, Time of Flight - Secondary Ion Mass Spectrometry (TOF-SIMS) is the trusted choice! Primary ions bombard the surface of a sample, resulting in the production of secondary ions. These ions arise exclusively from the first few monolayers of the sample surface. Mass spectrometry identification of these characteristic mass fragments allows for component identification (up to ~400Da) with high mass accuracy. Bombardment across the surface with an ion beam, provides chemical images at various sampling locations. Chemical composition can now be mapped across the surface or cross section of the sample, making it your PRIMARY, not secondary, surface analysis choice!
- Identify surface coated polymer additives
- Problem solve Adhesion deficiencies
- Trace component detection in positive and negative ion modes
- Screen for compositional surface differences
- Cross-Section profiling